Special issue : Reliability and performance of components and systems for power electronic applications

• Preface

  Guest Editors: Pr. Pascal Dherbécourt, Pr. Ahmed El Oualkadi

  1 - 2

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• Secured Failure Analysis Methodology for Accurate Diagnostic of Defects in GaN HEMT Technologies

  Jean-Guy TARTARIN

  3 - 13

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• Experimental and microscopic analysis of 600V GaN-GIT under the short-circuit aging tests

  Jianzhi FU

  14 - 19

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• An Improved SPICE Model for the Study of Electro-thermal Static Behavior for two New Generations of SiC MOSFET

  WADIA JOUHA, Pascal Dherbécourt, Ahmed El Oualkadi, Eric Joubert, Mohamed Masmoudi

  20 - 25

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• A Hybrid TSA-Fuzzy Logic Approach to Detect Induction Motor Rotor Faults

  abdennabi khiam, Nabil Ngote, Mohammed Ouassaid

  26 - 35

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