TARTARIN, Jean-Guy.
Secured Failure Analysis Methodology for Accurate Diagnostic of Defects in GaN HEMT Technologies.
International Journal of Information Science and Technology, [S.l.], v. 3, n. 1, p. 3 - 13, feb. 2019.
ISSN 2550-5114.
Available at: <https://www.innove.org/ijist/index.php/ijist/article/view/42>. Date accessed: 02 may 2024.
doi: http://dx.doi.org/10.57675/IMIST.PRSM/ijist-v3i1.42.